CERN Accelerating science

Article
Report number arXiv:1603.08841 ; MPP-2015-284 ; MPP-2015-284
Title Optimisation of the Read-out Electronics of Muon Drift-Tube Chambers for Very High Background Rates at HL-LHC and Future Colliders
Author(s) Nowak, Sebastian (Munich, Max Planck Inst.) ; Abovyan, Sergey (Munich, Max Planck Inst.) ; Gadow, Philipp (Munich, Max Planck Inst.) ; Ecker, Katharina (Munich, Max Planck Inst.) ; Fink, David (Munich, Max Planck Inst.) ; Fras, Markus (Munich, Max Planck Inst.) ; Kortner, Oliver (Munich, Max Planck Inst.) ; Kroha, Hubert (Munich, Max Planck Inst.) ; Müller, Felix (Munich, Max Planck Inst.) ; Richter, Robert (Munich, Max Planck Inst.) ; Schmid, Clemens (Munich, Max Planck Inst.) ; Schmidt-Sommerfeld, Korbinian (Munich, Max Planck Inst.) ; Zhao, Yazhou (Munich, Max Planck Inst.)
Publication 2016-10-06
Imprint 29 Mar 2016
Number of pages 3
In: 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, San Diego, CA, USA, 31 Oct - 7 Nov 2015, pp.7581815
DOI 10.1109/NSSMIC.2015.7581815
Subject category Detectors and Experimental Techniques
Accelerator/Facility, Experiment CERN LHC ; ATLAS
Abstract In the ATLAS Muon Spectrometer, Monitored Drift Tube (MDT) chambers and sMDT chambers with half of the tube diameter of the MDTs are used for precision muon track reconstruction. The sMDT chambers are designed for operation at high counting rates due to neutron and gamma background irradiation expected for the HL-LHC and future hadron colliders. The existing MDT read-out electronics uses bipolar signal shaping which causes an undershoot of opposite polarity and same charge after a signal pulse. At high counting rates and short electronics dead time used for the sMDTs, signal pulses pile up on the undershoot of preceding background pulses leading to a reduction of the signal amplitude and a jitter in the drift time measurement and, therefore, to a degradation of drift tube efficiency and spatial resolution. In order to further increase the rate capability of sMDT tubes, baseline restoration can be used in the read-out electronics to suppress the pile-up effects. A discrete bipolar shaping circuit with baseline restoration has been developed and used for reading out sMDT tubes under irradiation with a 24 MBq 90Sr source. The measurements results show a substantial improvement of the performance of the sMDT tubes at high counting rates.
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