001159533 001__ 1159533
001159533 003__ SzGeCERN
001159533 005__ 20161219100035.0
001159533 0247_ $$2DOI$$a10.5170/CERN-2008-008.436
001159533 0248_ $$aoai:cds.cern.ch:1159533$$pDOI$$pINIS$$pcerncds:FULLTEXT$$pcerncds:CERN:FULLTEXT$$pcerncds:CERN
001159533 041__ $$aeng
001159533 100__ $$aGaioni, L$$uINFN, Pavia$$uPavia U., Sci. Terra Dept.
001159533 245__ $$aInstrumentation for Gate Current Noise Measurements on sub-100 nm MOS Transistors
001159533 260__ $$c2008
001159533 260__ $$bCERN
001159533 520__ $$aThis work describes a measuring system that was developed to characterize the gate current noise performances of CMOS devices with minimum feature size in the 100 nm span. These devices play an essential role in the design of present daymixedsignal integrated circuits, because of the advantages associated with the scaling process. The reduction in the gate oxide thickness brought about by CMOS technology downscaling leads to a non-negligible gate current due to direct tunneling phenomena; this current represents a noise source which requires an accurate characterization for optimum analog design. In this paper, two instruments able to perform measurements in two different ranges of gate current values will be discussed. Some of the results of gate current noise characterization will also be presented.
001159533 65017 $$2SzGeCERN$$aDetectors and Experimental Techniques
001159533 690C_ $$aARTICLE
001159533 690C_ $$aYELLOWREPCONTRIB
001159533 690C_ $$aCERN
001159533 700__ $$aManghisoni, M$$uINFN, Pavia$$uBergamo U.
001159533 700__ $$aRatti, L$$uINFN, Pavia$$uPavia U., Sci. Terra Dept.
001159533 700__ $$aRe, V$$uINFN, Pavia$$uBergamo U.
001159533 700__ $$aSpeziali, V$$uINFN, Pavia$$uPavia U., Sci. Terra Dept.
001159533 700__ $$aTraversi, G$$uINFN, Pavia$$uBergamo U.
001159533 8564_ $$uhttp://documents.cern.ch/cgi-bin/setlink?base=yellowarticle&categ=2008-008&id=p436$$yPublished version from CERN
001159533 8564_ $$uhttp://cds.cern.ch/record/1159533/files/p436.pdf$$yPublished version from CERN
001159533 916__ $$sh$$w200904$$ya2009
001159533 960__ $$a13
001159533 961__ $$c20091105$$h1135$$lCER01$$x20090203
001159533 963__ $$aPUBLIC
001159533 962__ $$b1108885$$k436-440$$nnaxos20080915
001159533 970__ $$a002801562CER
001159533 980__ $$aARTICLE
001159533 980__ $$aConferencePaper