მთავარი > Characterization of 3D Trench PZT Capacitors for High Density FRAM Devices by Synchrotron X-ray Micro-diffraction |
Article | |
Title | Characterization of 3D Trench PZT Capacitors for High Density FRAM Devices by Synchrotron X-ray Micro-diffraction |
Author(s) | Shin, Sangmin ; Han, Hee ; JunPark, Yong ; Choi, Jae-Young ; Park, Youngsoo ; Baik, Sunggi |
Publication | 2007 |
In: | AIP Conf. Proc. 879 (2007) pp.1554-1556 |
In: | 9th International Conference On Synchrotron Radiation Instrumentation, Daegu, Korea, 28 May - 2 Jun 2006, pp.1554-1556 |